Published April 1, 2005 | Version v1
Journal article

Review of semiconductor drift detectors

  • 1. Politecnico di Milano, Dip. Di Elettronica e Informazione, Piazza Leonardo da Vinci 32, 20133 Milan (Italy)
  • 2. Brookhaven National Laboratory, Instrumentation Division, Bldg. 535 B, Upton NY 1973 (United States)

Description

A short review of semiconductor drift detectors is given. The emphasis is given to detectors intended for tracking of fast charged particles for experiments in particle physics and high energy heavy-ion physics. The use and performance of this kind of detector in past, present and future experiments is described together with the experience learned during the design, production and data taking phases

Additional details

Identifiers

DOI
10.1016/j.nima.2005.01.037;
PII
S0168-9002(05)00049-5;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
541
Journal Issue
1-2
Journal Page Range
p. 47-60
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
5. international symposium on development and application of semiconductor tracking detectors
Acronym
STD 5
Dates
14-17 Jun 2004
Place
Hiroshima (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37033543
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CHARGE TRANSPORT; DESIGN; HEAVY IONS; PERFORMANCE; POSITION SENSITIVE DETECTORS; SEMICONDUCTOR MATERIALS; SILICON
Descriptors DEC
CHARGED PARTICLES; ELEMENTS; IONS; MATERIALS; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMIMETALS

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.