Bond-length mapping without two-dimensional scanning by means of photoemission electron microscopy-extended X-ray absorption fine structure measurement

We develop a bond-length mapping technique without two-dimensional scanning by combining photoelectron emission microscopy with extended X-ray absorption fine structure (EXAFS) analysis. Several tens of thousands of EXAFS data are simultaneously acquired, which corresponds to a data acquisition time less than 1 second per spectrum. We apply this technique to an Fe/BaTiO₃ thin film, and two-dimensional distribution of the Fe-Fe bond length at the Fe surface is observed. >From the Fe K-edge EXAFS analysis, we find that the Fe-Fe bond length is ∼2.52 Å over the whole area with a Gaussian distribution of ∼0.01 Å, which implies that this technique realizes a bond-length mapping with precise bond-length determination. (author)