Published November 2005
| Version v1
Journal article
An n-port error model and calibration procedure for measuring the scattering matrices of lower-hybrid multijunctions
Creators
- 1. Centro de Fusao Nuclear, Associacao Euratom-IST, Instituto Superior Tecnico, 1049-001 Lisbon (Portugal)
Description
A method based on a generalization of the well-known two-port error model and calibration procedure employed by commercially available network analysers is presented to routinely test and measure the scattering (S) matrices of the multijunctions that build up lower-hybrid (LH) antennae. It accounts for the systematic errors inherent to microwave (mW) measurements, which appear as error coefficients determined via calibration standards, and it allows for any number of ports and for the use of adaptors between the measuring system and the device under test. Once the calibration is completed, the whole S-matrix of a LH multijunction, considered as a multiple-port mW device, can be swiftly and reliably measured
Additional details
Identifiers
- DOI
- 10.1016/j.fusengdes.2005.06.052;
- PII
- S0920-3796(05)00152-3;
Publishing Information
- Journal Title
- Fusion Engineering and Design
- Journal Volume
- 74
- Journal Issue
- 1-4
- Journal Page Range
- p. 413-417
- ISSN
- 0920-3796
- CODEN
- FEDEEE
Conference
- Title
- 23. symposium of fusion technology
- Acronym
- SOFT 23
- Dates
- 20-24 Sep 2004
- Place
- Venice (Italy)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37106299
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANTENNAS; CALIBRATION; CALIBRATION STANDARDS; ERRORS; LOWER HYBRID CURRENT DRIVE; LOWER HYBRID HEATING; MICROWAVE RADIATION; S MATRIX; SCATTERING
- Descriptors DEC
- ELECTRICAL EQUIPMENT; ELECTROMAGNETIC RADIATION; EQUIPMENT; HEATING; HIGH-FREQUENCY HEATING; MATRICES; NON-INDUCTIVE CURRENT DRIVE; PLASMA HEATING; RADIATIONS; STANDARDS
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.