Transient ionizing radiation effects and hardened design of Antifuse-based FPGA circuit

The γ transient Ionizing radiation effects of Antifuse-based FPGA Circuit were investgated using 'Qiangguang-I' accelerator. It was detected that γ transient Ionizing radiation result in FPGA registers were reset. So, in order to resolve the problem, the especial hardened antifuse-based FPGA circuit was designed, that comprises FPGA, FRAM and especial read-write soft. The transient Ionizing radiation experiment data proved that the design was successful in achieving the FPGA information saving and resume, avoiding γ transient radiation effects. (authors)