Published February 1987 | Version v1
Journal article

Temperature measurements of X-ray technique at the T-10 tokamak

  • 1. AN SSSR, Moscow. Inst. Kristallografii
  • 2. Gosudarstvennyj Komitet po Ispol'zovaniyu Atomnoj Ehnergii SSSR, Moscow. Inst. Atomnoj Ehnergii

Description

Determination of plasma ion temperature according to Doppler broadening of X-ray lines is descried. Radiation of highly ionized metal atoms finding their way into plasma from the diaphragm or toroidal chamber walls is used in measurements. The measured results for plasma ion temperature obtaind with a compact X-ray focusing spectrograph are given. A natural quartz plate cut in the 1340 plane is used as a crystal-analyzer. A microchannel light amplifier with X-ray converter serves as a detector. The K-51 phosphor (zinc sulphide) is put on one end (20x4 mm2) of a flexible fibre lightguide, with the other one is connected to the light amplifier. The spectrograph is installed at an inclined branch pipe of the tokamak at angle 60 deg with respect to the torus axis. The measurements are carried out along the central chord of plasma filament. Radiation from the 2.5 cm near-axial filament layer is registered by the detector. A spectrum part near the resonance line of He-like chromium is measured. In the experiments at the T-10 tokamak device the following ion temperature under conditions with joule plasma heating is found: Jp=175-300 kA, n-bare=(2-5)x1013 cm-3. An agreement (∼ 10%) between the determined ion temperatures Ti=0.5-0.7 keV and the results of corpuscular diagnostics is observed

Additional details

Additional titles

Original title (Russian)
Рентгеновские измерения ионной температуры на установке Т-10

Publishing Information

Journal Title
Fiz. Plazmy
Journal Volume
13
Journal Issue
2
Series
Fiz. Plazmy.
Journal Page Range
242-245
ISSN
0367-2921
CODEN
FIPLD