Published October 16, 2006
| Version v1
Journal article
Diffraction-aided laser-induced microstructuring of thin TiO2 films on glass
Creators
- 1. Condensed Matter Physics, University of Mons-Hainaut, 23 Avenue Maistriau, B-7000 Mons (Belgium)
Description
Thin films of TiO2 are deposited by magnetron sputtering on glass substrate and are irradiated by ultraviolet radiation using a KrF excimer laser. These thin films are patterned with a razor blade placed in the way of the radiation. When the fluence is in the 1250-1550 mJ/cm2 range, a regular structure appears, with controlled ablation of the films. It is shown that above a critical local fluence, the ablated depth varies linearly with the local fluence. The proportionality factor is shown to be equal to two photons per evaporated molecule
Additional details
Identifiers
- DOI
- 10.1063/1.2364462;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 89
- Journal Issue
- 16
- Journal Page Range
- p. 161114-161114.3
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38047069
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABLATION; DEPOSITION; DIFFRACTION; GLASS; KRYPTON FLUORIDE LASERS; PHOTONS; SPUTTERING; SUBSTRATES; THIN FILMS; TITANIUM OXIDES; ULTRAVIOLET RADIATION
- Descriptors DEC
- BOSONS; CHALCOGENIDES; COHERENT SCATTERING; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; EXCIMER LASERS; FILMS; GAS LASERS; LASERS; MASSLESS PARTICLES; OXIDES; OXYGEN COMPOUNDS; RADIATIONS; SCATTERING; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Notes
- (c) 2006 American Institute of Physics