Published October 13, 2004 | Version v1
Journal article

Nano-scale thin film investigations with slow polarized muons

Description

Muons with 100% spin polarization and whose energy can be continuously varied from 0.5 to 30 keV provide a novel extension of the μSR technique allowing depth dependent studies of thin films and multilayered structures in the range from ∼ 1 to ∼ 200 nm. For example it is possible to study magnetic field profiles near the surface of superconductors and directly determine fundamental quantities such as the magnetic penetration depth. Low energy muons (LE-μ+) also allow mapping the spin polarization in multilayered structures, for instance that of the conduction electrons of a non-magnetic buried layer in between thin ferromagnetic layers

Availability note (English)

Available online at http://stacks.iop.org/0953-8984/16/S4583/cm4_40_010.pdf or at the Web site for the Journal of Physics. Condensed Matter (ISSN 1361-648X) http://www.iop.org/

Additional details

Publishing Information

Journal Title
Journal of Physics. Condensed Matter
Journal Volume
16
Journal Issue
40
Journal Page Range
p. S4583-S4601
ISSN
0953-8984
CODEN
JCOMEL

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
36033930
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
Descriptors DEI
ELECTRONS; KEV RANGE; LAYERS; MAGNETIC FIELDS; MAPPING; MUONS PLUS; PENETRATION DEPTH; SPIN ORIENTATION; SUPERCONDUCTORS; SURFACES; THIN FILMS
Descriptors DEC
ANTILEPTONS; ANTIMATTER; ANTIPARTICLES; ELEMENTARY PARTICLES; ENERGY RANGE; FERMIONS; FILMS; LEPTONS; MATTER; MUONS; ORIENTATION