Published September 30, 2000 | Version v1
Journal article

Low-temperature scanning tunneling microscopy

  • 1. P.L. Kapitza Institute of Physical Problems, Russian Academy of Sciences, Moscow (Russian Federation)

Description

no abstract available

Availability note (English)

Available from http://dx.doi.org/10.1070/PU2000v043n09ABEH000807

Additional details

Publishing Information

Journal Title
Physics Uspekhi
Journal Volume
43
Journal Issue
9
Journal Page Range
p. 925-926
ISSN
1063-7869

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40071163
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Resource subtype / Literary indicator
No Abstract
Descriptors DEI
ATOMIC FORCE MICROSCOPY; MEASURING METHODS; SCANNING TUNNELING MICROSCOPY
Descriptors DEC
MICROSCOPY

Optional Information

Notes
Abstract only