Carrier control of β-FeSi2 by 1.2 MeV-Au++ ion irradiation
- 1. Department of Energy Science and Technology, Kyoto University, Sakyo-ku, Kyoto 606-8501 (Japan)
Description
We have investigated effects of 1.2 MeV-Au++ ion irradiation into β-FeSi2 samples which are synthesized by different processes. Such a high energy Au++ ion irradiation can be expected to induce Si and Fe vacancies in the β-FeSi2 lattice. After recrystallization of the lattice, we found that one of the samples showed conversion from the initial p-type conduction to the n-type one. RBS analysis revealed that irradiated Au atoms even after recrystallization by thermal annealing were not included in the β-FeSi2 layers. These results suggest that the Au atoms cannot contribute to conversion of the electrical conduction type observed. One possible explanation is that the highly induced Fe vacancy can play donor and its annihilation rate is much slower than that of Si vacancy that surely plays acceptor, so that carrier's compensation balance shifts toward n-type conduction. These results imply that vacancy-induction by high energy ion irradiation can be employed to control a conduction type of β-FeSi2
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2007.02.044Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2007.02.044;
- PII
- S0040-6090(07)00194-0;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 515
- Journal Issue
- 22
- Journal Page Range
- p. 8175-8178
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- Asia-Pacific conference on semiconducting silicides science and technology towards sustainable optoelectronics
- Acronym
- APAC-SILICIDE 2006
- Dates
- 29-31 Jul 2006
- Place
- Kyoto (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39069172
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNEALING; ANNIHILATION; GOLD IONS; ION BEAMS; IRON SILICIDES; IRRADIATION; LAYERS; MEV RANGE 01-10; RECRYSTALLIZATION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SYNTHESIS; VACANCIES
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ENERGY RANGE; HEAT TREATMENTS; INTERACTIONS; IONS; IRON COMPOUNDS; MEV RANGE; PARTICLE INTERACTIONS; POINT DEFECTS; SILICIDES; SILICON COMPOUNDS; SPECTROSCOPY; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.