Published August 15, 2007 | Version v1
Journal article

Carrier control of β-FeSi2 by 1.2 MeV-Au++ ion irradiation

  • 1. Department of Energy Science and Technology, Kyoto University, Sakyo-ku, Kyoto 606-8501 (Japan)

Description

We have investigated effects of 1.2 MeV-Au++ ion irradiation into β-FeSi2 samples which are synthesized by different processes. Such a high energy Au++ ion irradiation can be expected to induce Si and Fe vacancies in the β-FeSi2 lattice. After recrystallization of the lattice, we found that one of the samples showed conversion from the initial p-type conduction to the n-type one. RBS analysis revealed that irradiated Au atoms even after recrystallization by thermal annealing were not included in the β-FeSi2 layers. These results suggest that the Au atoms cannot contribute to conversion of the electrical conduction type observed. One possible explanation is that the highly induced Fe vacancy can play donor and its annihilation rate is much slower than that of Si vacancy that surely plays acceptor, so that carrier's compensation balance shifts toward n-type conduction. These results imply that vacancy-induction by high energy ion irradiation can be employed to control a conduction type of β-FeSi2

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2007.02.044

Additional details

Identifiers

DOI
10.1016/j.tsf.2007.02.044;
PII
S0040-6090(07)00194-0;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
515
Journal Issue
22
Journal Page Range
p. 8175-8178
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
Asia-Pacific conference on semiconducting silicides science and technology towards sustainable optoelectronics
Acronym
APAC-SILICIDE 2006
Dates
29-31 Jul 2006
Place
Kyoto (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39069172
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANNEALING; ANNIHILATION; GOLD IONS; ION BEAMS; IRON SILICIDES; IRRADIATION; LAYERS; MEV RANGE 01-10; RECRYSTALLIZATION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SYNTHESIS; VACANCIES
Descriptors DEC
BEAMS; CHARGED PARTICLES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ENERGY RANGE; HEAT TREATMENTS; INTERACTIONS; IONS; IRON COMPOUNDS; MEV RANGE; PARTICLE INTERACTIONS; POINT DEFECTS; SILICIDES; SILICON COMPOUNDS; SPECTROSCOPY; TRANSITION ELEMENT COMPOUNDS

Optional Information

Copyright
Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.