Motion of 1/3<111> dislocations on Σ3 (112) twin boundaries in nanotwinned copper
Creators
- 1. Beijing National Center for Electron Microscopy, Tsinghua University, Beijing 100084 (China)
- 2. Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016 (China)
Description
The atomic structure of Σ3 (112) ITBs in nanotwinned Cu is investigated by using aberration-corrected high resolution transmission electron microscopy (HRTEM) and in situ HRTEM observations. The Σ3 (112) ITBs are consisted of periodically repeated three partial dislocations. The in situ HRTEM results show that 1/3[111] partial dislocation moves on the Σ3 (112) incoherent twin boundary (ITB), which was accompanied by a migration of the ITB. A dislocation reaction mechanism is proposed for the motion of 1/3[111] Frank partial dislocation, in which the 1/3[111] partial dislocation exchanges its position with twin boundary dislocations in sequence. In this way, the 1/3[111] dislocation can move on the incoherent twin boundary in metals with low stacking fault energy. Meanwhile, the ITB will migrate in its normal direction accordingly. These results provide insight into the reaction mechanism of 1/3[111] dislocations and ITBs and the associated migration of ITBs
Additional details
Identifiers
- DOI
- 10.1063/1.4861868;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 115
- Journal Issue
- 2
- Journal Page Range
- p. 024310-024310.9
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45092482
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- CHARGED-PARTICLE TRANSPORT; COPPER; DISLOCATIONS; NANOSTRUCTURES; PERIODICITY; STACKING FAULTS; TRANSMISSION ELECTRON MICROSCOPY; TWINNING
- Descriptors DEC
- CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELECTRON MICROSCOPY; ELEMENTS; LINE DEFECTS; METALS; MICROSCOPY; RADIATION TRANSPORT; TRANSITION ELEMENTS; VARIATIONS
Optional Information
- Notes
- (c) 2014 AIP Publishing LLC