Published November 25, 2006 | Version v1
Journal article

Crystallography of deformation twin boundaries in a B2 type Ti-Ni alloy

  • 1. Department of Materials Science and Engineering, Kumamoto University, 2-39-1 Kurokami, Kumamoto 860-855 (Japan)
  • 2. Department of Molecular and Material Sciences, Interdisciplinary School of Engineering Science, Kyushu University, Kasuga 816-8580 (Japan)

Description

The deformation structure of B2 parent phase in Ti-Ni shape memory alloy around 573 K has been investigated by transmission electron microscopy. Serrations are seen in stress-strain curve, which corresponds to the formation of various planar defects of twin relation with respect to {1 1 2} {1 1 3}, {1 1 5}, {4 4 7} planes and so on. These defects can be expressed by particular Σ values on the basis of the coincidence site lattice model, since they are <1 1 0> symmetric tilt boundaries in a wide sense. It is also demonstrated that the sigma combination rule of the coincidence site lattice model can be applied to the triple junction of such defects

Additional details

Identifiers

DOI
10.1016/j.msea.2006.03.111;
PII
S0921-5093(06)00768-4;

Publishing Information

Journal Title
Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
Journal Volume
438-440
Journal Page Range
p. 495-499
ISSN
0921-5093
CODEN
MSAPE3

Conference

Title
International conference on martensitic transformations
Acronym
ICOMAT '05
Dates
14-17 Jun 2005
Place
Shanghai (China)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38082325
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CRYSTAL DEFECTS; CRYSTALLOGRAPHY; DEFORMATION; NICKEL ALLOYS; SHAPE MEMORY EFFECT; STRAINS; STRESSES; TITANIUM ALLOYS; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
ALLOYS; CRYSTAL STRUCTURE; ELECTRON MICROSCOPY; MICROSCOPY; TRANSITION ELEMENT ALLOYS

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.