Published November 2004 | Version v1
Journal article Metadata-only

Anisotropy of resonant inelastic X-ray scattering at the K edge of Si: theoretical analysis

Creators

  • 1. Japan Atomic Energy Research Inst., Synchrotron Radiation Research Center, Mikazuki, Hyogo (Japan)
  • 2. Ibaraki Univ., Faculty of Science, Mito, Ibaraki (Japan)

Description

We investigate theoretical the resonant inelastic X-ray scattering (RIXS) at the K edge of Si on the basis of an ab initio calculation. We calculate the RIXS spectra with systematically varying transferred-momenta, incident-photon energy and incident-photon polarization. We confirm the anisotropy of the experimental spectra by Y. Ma et al. [Phys. Rev. Lett. 74 (1995) 478], providing a quantitative explanation of the spectra. (author)

Additional details

Publishing Information

Journal Title
Journal of the Physical Society of Japan
Journal Volume
73
Journal Issue
11
Journal Page Range
p. 3171-3176
ISSN
0031-9015

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
36027223
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ANISOTROPY; BAND THEORY; COMPUTER CALCULATIONS; ENERGY SPECTRA; INELASTIC SCATTERING; PHOTONS; POLARIZATION; RESONANCE SCATTERING; SILICON; X-RAY DIFFRACTION
Descriptors DEC
BOSONS; COHERENT SCATTERING; DIFFRACTION; ELEMENTARY PARTICLES; ELEMENTS; INELASTIC SCATTERING; MASSLESS PARTICLES; SCATTERING; SEMIMETALS; SPECTRA

Optional Information

Notes
9 refs., 11 figs.