The probabilistic determination of intensities of completely overlapping reflections in powder diffraction patterns
Description
Two techniques are presented for the extraction of the individual intensities of completely overlapping reflections in a powder diffraction pattern. The first is analogous to Sayre's squaring method while the second is based upon maximizing the entropy of the Patterson function subject to the constraints imposed by the observed intensities of single and overlapping groups of reflections. Although both methods are superior to a simple equipartition of intensities amongst overlapping reflections, the maximum-entropy (ME) technique is the more robust and scientifically justifiable. The ME Patterson map extracts the maximum amount of information from the available observed intensities and is thus optimal for Patterson-technique structure determination from powder diffraction patterns. The agreement between true vertical strokeFvertical stroke2 values of overlapping reflections and the values obtained by maximum entropy is, in most simulated cases, excellent. (orig.)
Additional details
Publishing Information
- Journal Title
- J. Appl. Crystallogr.
- Journal Volume
- 20
- Journal Issue
- 4
- Series
- J. Appl. Crystallogr.
- Journal Page Range
- 316-319
- ISSN
- 0021-8898
- CODEN
- JACGA
INIS
- Country of Publication
- Denmark
- Country of Input or Organization
- Denmark
- INIS RN
- 18096435
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- BRAGG REFLECTION; ENTROPY; POWDERS; PROBABILITY; REFLECTION; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; PHYSICAL PROPERTIES; SCATTERING; THERMODYNAMIC PROPERTIES