Published June 2005 | Version v1
Journal article

Interference shake-up effects in the resonant Auger decay of krypton

  • 1. Rostov State University of TC, 344038 Rostov-on-Don (Russian Federation)
  • 2. I. Physikalisches Institut, Justus-Liebig-Universitaet, D-35392 Giessen (Germany)
  • 3. Fachbereich Physik, Technische Universitaet Kaiserslautern, D-67653 Kaiserslautern (Germany)

Description

Parameters of the resonant 4p 4p -3dε-bar Auger effect (RA) following the 3d-n p (n=5,6) excitation in Kr were calculated with taking into account the interference between several resonant and direct non-resonant transition amplitudes. For the first time all individual lines of the extended RA spectrum which comprises both the 4p4(1D) 5p and the 4p4(1D) 6p groups of final ionic states were considered. It was revealed that each group contains individual lines where the interference contributions have different signs thus providing a weak interference effect on the average over the whole group. Interference effects are found to be more pronounced in the angular distribution of the RA products

Additional details

Identifiers

DOI
10.1016/j.elspec.2005.01.121;
PII
S0368-2048(05)00089-7;

Publishing Information

Journal Title
Journal of Electron Spectroscopy and Related Phenomena
Journal Volume
144-147
Journal Page Range
p. 79-82
ISSN
0368-2048
CODEN
JESRAW

Conference

Title
14. international conference on vacuum ultraviolet radiation physics
Acronym
VUV 14
Dates
19-23 Jul 2004
Place
Cairns (Australia)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37039704
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANGULAR DISTRIBUTION; AUGER EFFECT; DECAY; ELECTRON SPECTRA; EXCITATION; INTERFERENCE; KRYPTON; PHOTOIONIZATION; TRANSITION AMPLITUDES
Descriptors DEC
AMPLITUDES; DISTRIBUTION; ELEMENTS; ENERGY-LEVEL TRANSITIONS; FLUIDS; GASES; IONIZATION; NONMETALS; RARE GASES; SPECTRA

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.