Published May 1975
| Version v1
Journal article
A cratering analysis for quantitative depth profiling by ion beam sputtering
Description
no abstract available
Additional details
Identifiers
Publishing Information
- Journal Title
- Surface Science
- Journal Volume
- 50
- Journal Issue
- 1
- Series
- Surf. Sci.
- Journal Page Range
- 29-52
- ISSN
- 0039-6028
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 6202521
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- DATA PROCESSING; DEPTH; INTEGRAL EQUATIONS; ION BEAMS; ION SCATTERING ANALYSIS; ION SPECTROSCOPY; KERNELS; SCATTERING; SPUTTERING
- Descriptors DEC
- BEAMS; CHEMICAL ANALYSIS; DIMENSIONS; EQUATIONS; NONDESTRUCTIVE ANALYSIS; SPECTROSCOPY
Optional Information
- Notes
- Updated automatically by Metadata and Full-Text Enrichment Agent