Dense hard disk ordering: influence of bidispersity and quenched disorder
Creators
- 1. The Institute of Mathematical Sciences, CIT Campus, Taramani, Chennai-600113 (India)
Description
Using Monte Carlo simulations, the impact on structural ordering in two-dimensional systems via the interplay of size bidispersity and quenched disorder in the form of an externally applied spatially random potential, is studied for a system of hard disks. By scanning across a wide range of dense packing fractions, size ratios and roughness of the applied potential, the phase diagram is constructed, which demonstrates that both quenched and size disorders shift the onset of translational order to higher packings, while maintaining the presence of the intermediate hexatic phase. At larger disorder strengths, the signatures of structural order are absent within the range of investigated packing fractions. Further, the dynamics with increasing potential strength is analysed for the mono-component system to obtain a spatio-temporal description of the melting process. Finally, the influence of the externally rough field on the Mermin–Wagner fluctuations, characteristic to two-dimensional systems, is investigated. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1361-648X/ab9b52Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Condensed Matter
- Journal Volume
- 32
- Journal Issue
- 41
- Journal Page Range
- [10 p.]
- ISSN
- 0953-8984
- CODEN
- JCOMEL
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52063159
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- COMPUTERIZED SIMULATION; MAGNETIC DISKS; MAGNETIZATION; MELTING; MONTE CARLO METHOD; PACKINGS; PHASE DIAGRAMS; POTENTIALS; ROUGHNESS; TWO-DIMENSIONAL SYSTEMS
- Descriptors DEC
- CALCULATION METHODS; CRYSTAL LATTICES; CRYSTAL STRUCTURE; DIAGRAMS; INFORMATION; MAGNETIC STORAGE DEVICES; MEMORY DEVICES; PHASE TRANSFORMATIONS; SIMULATION; SURFACE PROPERTIES