Development of an automatic smear sampler and evaluation of surface contamination
Creators
- 1. Div. Decommissioning Technol. Devmt., Korea Atomic Energy Res. Inst., 150 Deokjin-dong, Yuseong-gu, Daejeon 305-353 (Korea, Republic of)
Description
The surface contamination level of a radiation-controlled area is measured periodically according to atomic energy law and connection regulations. The measurement of surface contamination by an indirect method is subject to various kinds of error depending on the sampling person and consumes much time and effort in the sampling of large nuclear facilities. In this research, an automatic smear sampler is developed to solve these problems. The developed equipment is composed of a rotating sampling part, a sample transferring part, a power supply part a control part, and vacuum part. It improved the efficiency of estimation of the surface contamination level achieved periodically in a radiation-controlled area. Using an automatic smear sampler developed in this research, it is confirmed that radioactive contaminated materials are uniformly transferred to smear paper more than any sampling method by an operator. (authors)
Availability note (English)
Available from doi: http://dx.doi.org/10.1093/rpd/nch391Additional details
Identifiers
- DOI
- 10.1093/rpd/nch391;
Publishing Information
- Journal Title
- Radiation Protection Dosimetry
- Journal Volume
- 112
- Journal Issue
- 2
- Journal Page Range
- p. 287-290
- ISSN
- 0144-8420
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- France
- INIS RN
- 44059396
- Subject category
- S61: RADIATION PROTECTION AND DOSIMETRY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ACCURACY; ATOMIC ENERGY LAWS; COMPARATIVE EVALUATIONS; CONTROL; DECONTAMINATION; EFFICIENCY; NUCLEAR FACILITIES; OCCUPATIONAL EXPOSURE; POLLUTANTS; RADIOISOTOPES; REGULATIONS; SAMPLERS; SAMPLING; SENSITIVITY; SPECIFICITY; SURFACE CONTAMINATION
- Descriptors DEC
- CLEANING; CONTAMINATION; EQUIPMENT; EVALUATION; ISOTOPES; LAWS
Optional Information
- Notes
- 4 refs.