Radiation of a charge in presence of a dielectric object: aperture method
- 1. Saint-Petersburg State University, 7/9 Universitetskaya nab., St. Petersburg, 199034 (Russian Federation)
- 2. Saint Petersburg State Electrotechnical University "LETI", 5 Professora Popova, St. Petersburg, 197376 (Russian Federation)
Description
We develop an original method for calculation of radiation from a charge moving in the presence of a dielectric object. The method can be applied to objects which are larger than the wavelengths under consideration. First, the field of a charge in an infinite medium (without external boundaries) is calculated. Further the field at the external boundary of the object ("the aperture") is found using the Snell's and Fresnel's laws. At final step of this technique, we calculate the field outside the target using Stratton-Chu formulae ("aperture integrals"). Contrary to the ray-optic technique, this method is valid for the observation point with arbitrary wave parameter (including Fraunhofer area) as well as in neighborhoods of focuses and caustics. We apply the method developed to the cone with vacuum channel where the charge moves (axially symmetrical problem). As well, this problem is simulated using COMSOL Multiphysics. Comparing results of both techniques one can conclude that the aperture method can be applied even for relatively small objects which have the size of several wavelengths. It is important as well that the accuracy of calculations increases with an increase in the distance from the aperture.
Availability note (English)
Available from http://dx.doi.org/10.1088/1748-0221/13/02/C02033Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Instrumentation
- Journal Volume
- 13
- Journal Issue
- 02
- Journal Page Range
- p. C02033
- ISSN
- 1748-0221
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 51062664
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ACCURACY; APERTURES; COMPARATIVE EVALUATIONS; COMPUTERIZED SIMULATION; DIELECTRIC MATERIALS; OPTICS; WAVELENGTHS
- Descriptors DEC
- EVALUATION; MATERIALS; OPENINGS; SIMULATION