Influence of heat treatment on the optical properties and structure of Ge20Te80 films
- 1. Physics Department, Assiut University, Assiut (Egypt)
- 2. Physics Department, El-Azhar University, Assiut (Egypt)
Description
Ge20Te80 films were thermally evaporated onto ultrasonically cleaned glass substrates kept at room temperature. The as-deposited films showed an amorphous structure. An X-ray technique, a scanning electron microscope, and a transmission electron microscope were used to follow up the structural transformations that resulted from heat treatment. From the spectral dependence of the absorption coefficient, a direct electronic transition was mainly responsible for the photon absorption inside the films. The optical data indicated that the width of the localized states' tails increases while the optical gap decreases with an increase of the annealing temperature of the investigated films. The optical results have been interpreted on the basis of amorphous-crystalline transformations. (orig.)
Availability note (English)
Available from: http://dx.doi.org/10.1007/s00339-003-2153-1Additional details
Identifiers
Publishing Information
- Journal Title
- Applied Physics. A, Materials Science and Processing
- Journal Volume
- 78
- Journal Issue
- 4
- Journal Page Range
- p. 597-601
- ISSN
- 0947-8396
- CODEN
- APAMFC
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 35026747
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABSORPTION SPECTRA; ANNEALING; FILMS; GERMANIUM TELLURIDES; INFRARED SPECTRA; INTERMETALLIC COMPOUNDS; LEVEL WIDTHS; OPACITY; SCANNING ELECTRON MICROSCOPY; SPECTRAL REFLECTANCE; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0273-0400 K; TEMPERATURE RANGE 0400-1000 K; TRANSMISSION ELECTRON MICROSCOPY; ULTRAVIOLET SPECTRA; VISIBLE SPECTRA; X-RAY DIFFRACTION
- Descriptors DEC
- ALLOYS; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; GERMANIUM COMPOUNDS; HEAT TREATMENTS; MICROSCOPY; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; SCATTERING; SPECTRA; TELLURIDES; TELLURIUM COMPOUNDS; TEMPERATURE RANGE