Time-resolved X-ray absorption spectroscopy and its applied researches
Creators
- 1. High Energy Accelerator Research Organization (KEK), Institute of Materials Structure Science, Tsukuba, Ibaraki (Japan)
Description
The time-resolved dispersive XAFS (DXAFS) system for irreversible processes has been developed at the NW2A beamline of PF-AR. Combining the DXAFS system that can detect one pulse x-ray of duration ∼100 ps emitted every 1.26 μs from PF-AR with a high power pulsed laser enabled elucidation of laser-driven irreversible processes with nanosecond to subnanosecond time resolution. We applied the system to the laser compression and laser ablation process of metals as an irreversible process, and succeeded in obtaining the time evolution of the processes under extreme conditions from the change of XAFS spectra obtained. In the case of laser compression of copper, it was found that copper was compressed by about 2% in volume after 4 ns from laser irradiation and the pressure was released over 200 ns. A part of this report is derived in part form an article published in High Pressure Research on 2 Aug 2016, available online at : http://www.tandfonline.com/10.1080/08957959.2016.1211647. (author)
Additional details
Additional titles
- Original title (Japanese)
- 時間分解X線吸収分光法とその応用研究
Identifiers
Publishing Information
- Imprint Title
- Proceedings of the 19th KEK mechanical engineering workshop
- Imprint Pagination
- 76 p.
- Journal Page Range
- p. 11-14
- Report number
- KEK-PROC--2018-2
Conference
- Title
- 19. KEK mechanical engineering workshop
- Dates
- 13 Apr 2018
- Place
- Tsukuba, Ibaraki (Japan)
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 55006371
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- BRAGG REFLECTION; COORDINATION NUMBER; IONIZATION CHAMBERS; LASER RADIATION; LIGHT SOURCES; PIEZOELECTRICITY; POSITION SENSITIVE DETECTORS; REACTION KINETICS; STRUCTURE FUNCTIONS; SYNCHROTRON RADIATION; TIME RESOLUTION; X-RAY SPECTROSCOPY
- Descriptors DEC
- BREMSSTRAHLUNG; ELECTRICITY; ELECTROMAGNETIC RADIATION; FUNCTIONS; KINETICS; MEASURING INSTRUMENTS; RADIATION DETECTORS; RADIATION SOURCES; RADIATIONS; REFLECTION; RESOLUTION; SPECTROSCOPY; TIMING PROPERTIES
Optional Information
- Notes
- 12 refs., 4 figs., 1 tabs. Imprint:#7B2C#19#56DE##9AD8##30A8##30CD##7814##30E1##30AB##FF65##30EF##30FC##30AF##30B7##30E7##30C3##30D7##5831##544A##96C6#