Published May 2008
| Version v1
Journal article
Resonant detection of terahertz radiation utilizing plasma waves in high-electron-mobility transistors
Creators
- 1. State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences and Graduate School of Chinese Academy of Sciences, Shanghai 200050 (China)
Description
This paper theoretically studies the high-electron-mobility transistor (HEMT) driven by the terahertz radiation. It calculates the gate-to-source/drain admittance and the detection responsivity of the HEMT as a function of the signal frequency. It finds that the peaks of the admittances and the responsivity show redshift, and the heights of the peaks decrease with increasing the lengths of the source-to-gate and gate-to-drain spacing. Such phenomena may be useful in designing different HEMTs by utilizing the effects associated with the plasma oscillations excitation
Availability note (English)
Available from http://dx.doi.org/10.1088/1674-1056/17/5/051Additional details
Identifiers
Publishing Information
- Journal Title
- Chinese Physics. B
- Journal Volume
- 17
- Journal Issue
- 5
- Journal Page Range
- p. 1854-1857
- ISSN
- 1674-1056
INIS
- Country of Publication
- China
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44125163
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- ELECTRON MOBILITY; EXCITATION; FREQUENCY DEPENDENCE; PLASMA WAVES; RED SHIFT; THZ RANGE; TRANSISTORS
- Descriptors DEC
- ENERGY-LEVEL TRANSITIONS; FREQUENCY RANGE; MOBILITY; PARTICLE MOBILITY; SEMICONDUCTOR DEVICES