Tailoring of multiferroic properties of BiFeO/sub 3/ thin films by cation substitution
Creators
- 1. Comsats Inst. of Information Technology, Park Road, Islamabad (Pakistan). Dept. of Physics
- 2. CSMM, NUS, Singapore (Singapore)
Description
Mn-doped multiferroic BiFeO/sub 3/ (BFMO) thin films were deposited on LaNiO/sub 3/(LNO)/SrTiO/sub 3/(STO)/Si(100) substrates by pulsed laser deposition (PLD) technique. X-ray diffraction (XRD) showed that films were bicrystalline single phase with (110) preferential orientation. Multiferroic top layer and oxide bottom electrode (LNO) epitaxially followed the buffer layer (STO). Oxygen partial pressure during deposition proved to be critical for phase formation, crystallinity and resistivity of the films. Atomic force microscopic (AFM) studies revealed the smooth, dense and crack free surfaces of the films. Cross-section view of the multilayers by field emission scanning electron microscope (FE-SEM) gave their thickness. Mn substitution resulted in the increase of magnetization saturation, coercive field and clarity of hysteresis loop. The magneto-electric (ME) effect was demonstrated by measuring the dielectric response in a varying magnetic field. Optimally deposited BFMO films show saturated P-E loop. (author)
Additional details
Publishing Information
- Publisher
- Trans Tech Publications, Switzerland
- Imprint Place
- Stafa-Zurich (Switzerland)
- Imprint Title
- 11 International Symposium on Advanced Materials
- Imprint Pagination
- 468 p.
- Journal Page Range
- p. 102-108
Conference
- Title
- 11 International Symposium on Advanced Materials
- Dates
- 8-12 Aug 2009
- Place
- Islamabad (Pakistan)
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- Pakistan
- INIS RN
- 41096142
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BICRYSTALS; BISMUTH OXIDES; CATIONS; DIELECTRIC PROPERTIES; FERRIMAGNETIC MATERIALS; IRON OXIDES; LANTHANUM OXIDES; MANGANESE; SCANNING ELECTRON MICROSCOPY; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- BISMUTH COMPOUNDS; CHALCOGENIDES; CHARGED PARTICLES; COHERENT SCATTERING; CRYSTALS; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; ELEMENTS; FILMS; IONS; IRON COMPOUNDS; LANTHANUM COMPOUNDS; MAGNETIC MATERIALS; MATERIALS; METALS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; POLYCRYSTALS; RARE EARTH COMPOUNDS; SCATTERING; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS