Published 1989 | Version v1
Miscellaneous Metadata-only

Beam profile monitor by the method of rest gas ionisation

Creators

  • 1. Max-Planck-Institut fuer Kernphysik, Heidelberg (Germany, F.R.)
  • 2. Heidelberg Univ. (Germany, F.R.). Physikalisches Inst.
  • 3. Lawrence Berkeley Lab., CA (USA)
  • 4. Nehezipari Mueszaki Egyetem, Miskolc (Hungary)

Description

Described is the concept of a residual gas ionization beam profile monitor for TSR. The mechanical design of the device is in progress. The horizontal profile is obtained from the spatial distribution of electrons arriving at a microchannel plate detector. The vertical profile will be derived from the arrival time of ions at an electrode in the same profile monitor unit. A spatial resolution of ±0.85 mm and measuring times on the order of 0.1 s for histograms of good statistics are envisaged. (orig.)

Additional details

Additional titles

Original title (German)
Strahlprofilmonitor nach der Methode der Restgasionisation zur schnellen Strahlprofilmessung im TSR

Publishing Information

Imprint Title
Max-Planck-Institute for Nuclear Physics. Annual report 1988
Imprint Pagination
200 p.
Journal Page Range
p. 96-97.
Report number
INIS-mf--12006

INIS

Country of Publication
Germany
Country of Input or Organization
Germany
INIS RN
20085995
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
BEAM MONITORING; BEAM MONITORS; BEAM PROFILES; ELECTRODES; ELECTRON DETECTION; ELECTRON MULTIPLIER DETECTORS; ELECTRONS; ION BEAMS; ION COLLISIONS; IONIZATION; MICROCHANNEL ELECTRON MULTIPLI; SPATIAL RESOLUTION; STORAGE RINGS
Descriptors DEC
BEAMS; CHARGED PARTICLE DETECTION; COLLISIONS; DETECTION; ELECTRON MULTIPLIERS; ELECTRON TUBES; ELEMENTARY PARTICLES; FERMIONS; LEPTONS; MEASURING INSTRUMENTS; MONITORING; MONITORS; RADIATION DETECTION; RADIATION DETECTORS; RESOLUTION

Optional Information

Notes
Imprint:Max-Planck-Institut fuer Kernphysik. Jahresbericht 1988.