Formation of non-substitutional β-Sn defects in Ge1−xSnx alloys
- 1. Instituto Balseiro, Univ. Nac. de Cuyo and CNEA, 8400 Bariloche (Argentina)
- 2. Centro Atómico Bariloche-CNEA and CONICET, Av. Bustillo 9500, R8402AGP Bariloche (Argentina)
- 3. Sede Andina, Univ. Nac. de Río Negro, 8400 Bariloche (Argentina)
- 4. Instituto de Física, U.N.A.M., 01000 Mexico, D.F. (Mexico)
Description
Although group IV semiconductor alloys are expected to form substitutionally, in Ge1−xSnx this is true only for low concentrations (x < 0.13). The use of these alloys as a narrow gap semiconductor depends on the ability to produce samples with the high quality required for optoelectronic device applications. In a previous paper, we proposed the existence of a non-substitutional complex defect (β-Sn), consisting of a single Sn atom in the center of a Ge divacancy, which may account for the segregation of Sn at large x. Afterwards, the existence of this defect was confirmed experimentally. In this paper we study the local environment and the interactions of the substitutional defect (α-Sn), the vacancy in Ge, and the β-Sn defect by performing extensive numerical ab initio calculations. Our results confirm that a β-Sn defect can be formed by natural diffusion of a vacancy around the substitutional α-Sn defect, since the energy barrier for the process is very small
Additional details
Identifiers
- DOI
- 10.1063/1.4829697;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 114
- Journal Issue
- 19
- Journal Page Range
- p. 193508-193508.5
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45079981
- Subject category
- S36: MATERIALS SCIENCE; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- ABUNDANCE; ALLOYS; DEFECTS; DIFFUSION BARRIERS; INTERACTIONS; SEGREGATION; SEMICONDUCTOR MATERIALS; VACANCIES
- Descriptors DEC
- CRYSTAL DEFECTS; CRYSTAL STRUCTURE; MATERIALS; POINT DEFECTS
Optional Information
- Notes
- (c) 2013 AIP Publishing LLC