Published April 1976 | Version v1
Journal article

Emittance and brightness of multiply-charged ion beams from duopigatron and duoplasmatron sources

  • 1. Paris Univ., Orsay, France

Description

The systematic study of the dependence of the charge state density distribution (CSDD) on the discharge parameters of both the duopigatron and the duoplasmatron sources was conducted. The experimental data show that for both sources the optimum conditions for multiply-charged ion production correspond to the operation of the discharge at points between two different modes. In particular, the pressure must be matched to a minimum value corresponding to the arc starvation mode. Under this condition the discharge exhibits large level fluctuations which are correlated with enlarged ion energy spreads. However, the instability level can (particularly in the duopigatron) be minimized by a proper choice of the magnetic field shape and magnetic field strength. In order to describe more completely the source performances, the emittance and brightness were measured under optimum conditions for production of multiply-charged ions in our design. Solutions were proposed to improve emittance and brightness by the adaptation of a plasma expansion cup. These solutions do not inversely affect the CSDD. The obtained performances are compared with other experiments

Additional details

Identifiers

Publishing Information

Journal Title
IEEE Transactions on Nuclear Science
Journal Volume
23
Journal Issue
2
Series
IEEE Trans. Nucl. Sci.
Journal Page Range
1088-1092
ISSN
0018-9499

Conference

Title
International conference on heavy ion sources.
Dates
27 Oct 1975.
Place
Gatlinburg, TN, USA.

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
7260759
Subject category
S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ACCELERATORS; BEAM EMITTANCE; BRIGHTNESS; DUOPLASMATRONS; MAGNETIC FIELDS; OPTIMIZATION; PENNING ION SOURCES; PERFORMANCE TESTING; PRESSURE DEPENDENCE
Descriptors DEC
ELECTRON TUBES; ION SOURCES; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; PLASMATRONS; TESTING

Optional Information

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