Published September 1976
| Version v1
Journal article
Capacitance and ellipsometrically determined oxide thickness of Nb-oxide-Pb Josephson tunnel junctions
Creators
- 1. Thomas J. Watson Research Center, Yorktown Heights, New York 10598
Description
The capacitance of Nb-oxide-Pb Josephson tunnel junctions was determined from the self-resonance phenomenon in the Josephson
Additional details
Identifiers
- DOI
- 10.1063/1.323289;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 47
- Journal Issue
- 9
- Series
- J. Appl. Phys.
- Journal Page Range
- 4201-4202
- ISSN
- 0021-8979
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 8281530
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ELECTRICAL PROPERTIES; FILMS; JOSEPHSON JUNCTIONS; LEAD; NIOBIUM; NIOBIUM OXIDES; THICKNESS; TUNNEL EFFECT
- Descriptors DEC
- CHALCOGENIDES; DIMENSIONS; ELEMENTS; METALS; NIOBIUM COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SEMICONDUCTOR JUNCTIONS; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Notes
- Updated automatically by Metadata and Full-Text Enrichment Agent