Published February 2008 | Version v1
Journal article

Apparatus to study crystal channeling and volume reflection phenomena at the SPS H8 beamline

  • 1. CERN, European Organization for Nuclear Research, CH-1211 Geneva 23 (Switzerland)
  • 2. Fermi National Accelerator Laboratory, P.O. Box 500, Batavia, Illinois 60510-0500 (United States)
  • 3. Dipartimento di Fisica, Universita di Padova, Via Marzolo 8, 35131 Padova (Italy)
  • 4. INFN Laboratori Nazionali di Legnaro, Viale Universita 2, 35020 Legnaro (Italy)
  • 5. Dipartimento di Ingegneria dei Materiali e Tecnologie Industriali, Universita di Trento, Via Mesiano 77, 38050 Trento (Italy)
  • 6. INFM-CNR, Via Valotti 9, 25133 Brescia (Italy)
  • 7. INFN Sezione di Ferrara, Dipartimento di Fisica, Universita di Ferrara, Via Saragat 1, 44100 Ferrara (Italy)
  • 8. INFN Sezione di Perugia and Universita degli Studi di Perugia, Dipartimento di Fisica, Via Pascoli, 06123 Perugia (Italy)

Description

A high performance apparatus has been designed and built by the H8-RD22 collaboration for the study of channeling and volume reflection phenomena in the interaction of 400 GeV/c protons with bent silicon crystals, during the 2006 data taking in the external beamline H8 of the CERN SPS. High-quality silicon short crystals were bent by either anticlastic or quasimosaic effects. Alignment with the highly parallel (8 μrad divergence) proton beam was guaranteed through a submicroradian goniometric system equipped with both rotational and translational stages. Particle tracking was possible by a series of silicon microstrip detectors with high-resolution and a parallel plate gas chamber, triggered by various scintillating detectors located along the beamline. Experimental observation of volume reflection with 400 GeV/c protons proved true with a deflection angle of (10.4±0.5) μrad with respect to the unperturbed beam, with a silicon crystal whose (111) planes were parallel to the beam

Additional details

Identifiers

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
79
Journal Issue
2
Journal Page Range
p. 023303-023303.8
ISSN
0034-6748
CODEN
RSINAK

Optional Information

Notes
(c) 2008 American Institute of Physics