Experimental study of visible and ultraviolet impurity emission from the Alcator C tokamak
Description
Densities of carbon, oxygen, and silicon in Alcator C tokamak plasmas have been computed from spectroscopic measurements of the absolute brightnesses of visible and ultraviolet emission lines in combination with a one dimensional numerical calculation which models the charge state and emissivity profiles. Profiles of all the charge states of a particular impurity were calculated by utilizing independent measurements of plasma density and temperature and solving the coupled system of transport and rate equations connecting the ionization states. These profiles were then used to calculate emissivity and brightness profiles by solving the matrix equation relating the level populations through atomic processes such as electron impact excitation, de-excitation, spontaneous emission and cascades from upper levels. Good agreement was found between predicted impurity line brightnesses and experimentally measured brightnesses of different charge states. Three different types of limiter materials, molybdenum, graphite and SiC coated graphite have been used on Alcator C. It was determined that the principal impurities in the plasma, under most conditions, depends upon the type of limiter being used. However, the sources of the impurities are both the wall and the limiters, since it was observed that the wall becomes coated with limiter material due to plasma discharges
Availability note (English)
MF available from INIS under the Report Number; Available from NTIS, PC A07/MF A01; 1 as DE86003751.
Files
Additional details
Publishing Information
- Imprint Pagination
- 138 p.
- Report number
- DOE/ET/51013--160
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 17037743
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Thesis
- Descriptors DEI
- ALCATOR DEVICE; CARBON IONS; GRAPHITE; IMPURITIES; IONIZATION; LIMITERS; MOLYBDENUM; OXYGEN IONS; SILICON CARBIDES; SILICON IONS; SPECTROSCOPY; ULTRAVIOLET RADIATION; VISIBLE RADIATION
- Descriptors DEC
- ATOMIC IONS; CARBIDES; CARBON; CARBON COMPOUNDS; CHARGED PARTICLES; CLOSED PLASMA DEVICES; ELECTROMAGNETIC RADIATION; ELEMENTS; IONS; METALS; NONMETALS; RADIATIONS; SILICON COMPOUNDS; THERMONUCLEAR DEVICES; TOKAMAK DEVICES; TRANSITION ELEMENTS
Optional Information
- Secondary number(s)
- PFC/RR--85-20.