Published 2006
| Version v1
Book
Structure and morphology of Ni films by neutron reflectometry and AFM
- 1. Solid State Physics Division, Bhabha Atomic Research Centre, Mumbai (India)
- 2. Spectroscopy Division, Bhabha Atomic Research Centre, Mumbai (India)
Description
The morphology of its surface and interface roughness is known to substantially affect the properties of a thin film. Neutron reflectivity and AFM has been used to characterize two Ni thin films grown by r.f. sputtering. We get a complete picture with respect to interface roughness and surface morphology from these two data sets, which are complementary to each other. (author)
Additional details
Publishing Information
- Publisher
- Prime Time Education
- Imprint Place
- Mumbai (India)
- ISBN
- 81-8372-030-7
- Imprint Title
- Proceedings of the DAE solid state physics symposium. V. 51
- Imprint Pagination
- 1058 p.
- Journal Page Range
- p. 569-570
Conference
- Title
- 51. DAE solid state physics symposium
- Dates
- 26-30 Dec 2006
- Place
- Bhopal (India)
INIS
- Country of Publication
- India
- Country of Input or Organization
- India
- INIS RN
- 38112601
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; FCC LATTICES; MORPHOLOGY; NEUTRON REFLECTORS; NICKEL; SPUTTERING; THIN FILMS
- Descriptors DEC
- CRYSTAL LATTICES; CRYSTAL STRUCTURE; CUBIC LATTICES; ELEMENTS; FILMS; METALS; MICROSCOPY; TRANSITION ELEMENTS
Optional Information
- Notes
- 9 refs., 3 figs., 2 tabs.