Self-consistent, unbiased root-mean-square emittance analysis
- 1. SNS, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States)
- 2. SNS, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37830 (United States)
Description
We present a self-consistent method for analyzing measured emittance data that yields unbiased estimates for the root-mean-square (rms) emittance. The self-consistent, unbiased elliptical exclusion analysis uses an ellipse to determine the bias from the data outside the ellipse, before calculating the rms emittance from the bias-subtracted data within the ellipse. Increasing the ellipse size until the rms emittance estimate saturates allows for determining the minimum elliptical area that includes all real signals, even those buried in the noise. Variations of the ellipse shape and orientations are used to test the robustness of the results. Background fluctuations cause fluctuations in the rms emittance estimate, which are an estimate of the uncertainty incurred through the analysis
Additional details
Identifiers
- DOI
- 10.1063/1.1695649;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 75
- Journal Issue
- 5
- Journal Page Range
- p. 1646-1649
- ISSN
- 0034-6748
- CODEN
- RSINAK
Conference
- Title
- 10. international conference on ion sources (ICIS)
- Dates
- 8-13 Sep 2003
- Place
- Dubna (Russian Federation)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36028216
- Subject category
- S72: PHYSICS OF ELEMENTARY PARTICLES AND FIELDS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM EMITTANCE; CALCULATION METHODS; FLUCTUATIONS; ORIENTATION; PARTICLE BEAMS; YIELDS
- Descriptors DEC
- BEAMS; VARIATIONS
Optional Information
- Notes
- (c) 2004 American Institute of Physics.