Published May 2004 | Version v1
Journal article

Self-consistent, unbiased root-mean-square emittance analysis

  • 1. SNS, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States)
  • 2. SNS, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37830 (United States)

Description

We present a self-consistent method for analyzing measured emittance data that yields unbiased estimates for the root-mean-square (rms) emittance. The self-consistent, unbiased elliptical exclusion analysis uses an ellipse to determine the bias from the data outside the ellipse, before calculating the rms emittance from the bias-subtracted data within the ellipse. Increasing the ellipse size until the rms emittance estimate saturates allows for determining the minimum elliptical area that includes all real signals, even those buried in the noise. Variations of the ellipse shape and orientations are used to test the robustness of the results. Background fluctuations cause fluctuations in the rms emittance estimate, which are an estimate of the uncertainty incurred through the analysis

Additional details

Identifiers

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
75
Journal Issue
5
Journal Page Range
p. 1646-1649
ISSN
0034-6748
CODEN
RSINAK

Conference

Title
10. international conference on ion sources (ICIS)
Dates
8-13 Sep 2003
Place
Dubna (Russian Federation)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
36028216
Subject category
S72: PHYSICS OF ELEMENTARY PARTICLES AND FIELDS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BEAM EMITTANCE; CALCULATION METHODS; FLUCTUATIONS; ORIENTATION; PARTICLE BEAMS; YIELDS
Descriptors DEC
BEAMS; VARIATIONS

Optional Information

Notes
(c) 2004 American Institute of Physics.