Published October 2008 | Version v1
Journal article

New stressed and continuously annealed low μ nanocrystalline FeCuNbSiB cores for watt-hour-metering or differential mode inductance applications

  • 1. Imphy Alloys, Centre de Recherches, 58160 Imphy (France)

Description

A new stress annealing device applied to Fe base nanocrystalline ribbon is presented. It is based on three stages of very different tensile stress level, able to produce continuously a low and well-controlled μr ribbon, with surprisingly reduced brittleness allowing further winding into core for application such as watt-hour-metering or inductance coil. For such applications we have paid attention to the B-H linearity which may be optimized with the help of process parameters such as stress and annealing temperature, their role being described by an additional interphase magnetoelastic term. The stress participates also to the nucleation and is thought to be the cause of brittleness improvement in troubling SiFe ordering and promoting nucleation rather than growth

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jmmm.2008.04.167

Additional details

Identifiers

DOI
10.1016/j.jmmm.2008.04.167;
PII
S0304-8853(08)00496-4;

Publishing Information

Journal Title
Journal of Magnetism and Magnetic Materials
Journal Volume
320
Journal Issue
20
Journal Page Range
p. e797-e801
ISSN
0304-8853
CODEN
JMMMDC

Conference

Title
18. international symposium on soft magnetic materials
Dates
2-5 Sep 2007
Place
Cardiff (United Kingdom)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40009388
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANNEALING; BRITTLENESS; CRYSTALS; INDUCTANCE; MAGNETIC MATERIALS; NANOSTRUCTURES; POWER METERS; STRESSES
Descriptors DEC
ELECTRIC MEASURING INSTRUMENTS; ELECTRICAL EQUIPMENT; ELECTRICAL PROPERTIES; EQUIPMENT; HEAT TREATMENTS; MATERIALS; MEASURING INSTRUMENTS; MECHANICAL PROPERTIES; METERS; PHYSICAL PROPERTIES

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.