New stressed and continuously annealed low μ nanocrystalline FeCuNbSiB cores for watt-hour-metering or differential mode inductance applications
Creators
- 1. Imphy Alloys, Centre de Recherches, 58160 Imphy (France)
Description
A new stress annealing device applied to Fe base nanocrystalline ribbon is presented. It is based on three stages of very different tensile stress level, able to produce continuously a low and well-controlled μr ribbon, with surprisingly reduced brittleness allowing further winding into core for application such as watt-hour-metering or inductance coil. For such applications we have paid attention to the B-H linearity which may be optimized with the help of process parameters such as stress and annealing temperature, their role being described by an additional interphase magnetoelastic term. The stress participates also to the nucleation and is thought to be the cause of brittleness improvement in troubling SiFe ordering and promoting nucleation rather than growth
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jmmm.2008.04.167Additional details
Identifiers
- DOI
- 10.1016/j.jmmm.2008.04.167;
- PII
- S0304-8853(08)00496-4;
Publishing Information
- Journal Title
- Journal of Magnetism and Magnetic Materials
- Journal Volume
- 320
- Journal Issue
- 20
- Journal Page Range
- p. e797-e801
- ISSN
- 0304-8853
- CODEN
- JMMMDC
Conference
- Title
- 18. international symposium on soft magnetic materials
- Dates
- 2-5 Sep 2007
- Place
- Cardiff (United Kingdom)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40009388
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNEALING; BRITTLENESS; CRYSTALS; INDUCTANCE; MAGNETIC MATERIALS; NANOSTRUCTURES; POWER METERS; STRESSES
- Descriptors DEC
- ELECTRIC MEASURING INSTRUMENTS; ELECTRICAL EQUIPMENT; ELECTRICAL PROPERTIES; EQUIPMENT; HEAT TREATMENTS; MATERIALS; MEASURING INSTRUMENTS; MECHANICAL PROPERTIES; METERS; PHYSICAL PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.