Atomic motion of resonantly vibrating quartz crystal visualized by time-resolved X-ray diffraction

Transient atomic displacements during a resonant thickness-shear vibration of AT-cut α-quartz are revealed by time-resolved X-ray diffraction under an alternating electric field. The lattice strain resonantly amplified by the alternating electric field is ∼10⁴ times larger than that induced by a static electric field. The resonantly amplified lattice strain is achieved by fast displacements of oxygen anions and collateral resilient deformation of Si−O−Si angles bridging rigid SiO₄ tetrahedra, which efficiently transduce electric energy into elastic energy