Published July 1983
| Version v1
Journal article
On the nature of electron diffuse scattering in lead tellurides thin films
Description
Electron diffraction and electron-microscopy investigations into the structure of lead telluride thin films with different degree of deviation from stoichiometry are performed. The diference in the behaviour.of images of coherent diffuse scattering following annealing of lead telluride films with different deviation from stoichiometry is shown to indicate the dual nature of the cause of that difference. Along with thermal lattice vibrations, ordered ''antistructural'' defects, positioned in the form of single-atom chains Pb-Pb-along the < 001 > directions, contribute to the intensity of diffuse electron scattering
Additional details
Additional titles
- Original title (Russian)
- О природе диффузного рассеяния электронов в тонких пленках теллурида свинца
Publishing Information
- Journal Title
- Izv. Akad. Nauk SSSR, Ser. Fiz.
- Journal Volume
- 47
- Journal Issue
- 6
- Series
- Izv. Akad. Nauk SSSR, Ser. Fiz.
- Journal Page Range
- 1209-1212
- ISSN
- 0367-6765
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- USSR
- INIS RN
- 15050786
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ANNEALING; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; FILMS; IMAGES; LEAD ADDITIONS; LEAD TELLURIDES; MONOCRYSTALS
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; CRYSTALS; DIFFRACTION; HEAT TREATMENTS; LEAD COMPOUNDS; MICROSCOPY; SCATTERING; TELLURIDES; TELLURIUM COMPOUNDS
Optional Information
- Notes
- For English translation see the journal Bulletin of the Academy of Sciences of the USSR, Physical Series (USA).