Perpendicular magnetic anisotropy and structural properties of NiCu/Cu multilayers
- 1. Department of Materials Science and Metallurgy and IRC in Superconductivity, University of Cambridge, Pembroke Street, Cambridge CB2 3QZ (United Kingdom)
- 2. INFM and Dipartimento Scienze Fisiche, Universita di Napoli Federico II, Piazzale Tecchio 80-80125 Naples (Italy)
Description
Perpendicular magnetic anisotropy (PMA) was studied at low temperature (T=30 K) in dc-magnetron sputtered Ni60Cu40/Cu multilayers. PMA has been observed in many multilayer structures for ferromagnetic layer thicknesses less than a certain thickness tperpendicular. In general cases tperpendicular is less than a few nanometers, making such structures unsuitable for low-cost fabrication techniques. Our results show a strong perpendicular easy direction of magnetization for NiCu layer thickness between 4.2 nm and 34 nm. The thickness tperpendicular at which the multilayers change the preferential orientation from perpendicular to in-plane is estimated to be 55 nm. Structural studies show that the low magnetostatic energy density is likely to be the main reason for the large tperpendicular value obtained in this system
Additional details
Identifiers
- DOI
- 10.1063/1.1757658;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 96
- Journal Issue
- 1
- Journal Page Range
- p. 512-518
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36062517
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANISOTROPY; COPPER ALLOYS; DEPOSITION; ENERGY DENSITY; FERROMAGNETIC MATERIALS; MAGNETIZATION; MAGNETRONS; NICKEL ALLOYS; SPUTTERING; THICKNESS
- Descriptors DEC
- ALLOYS; DIMENSIONS; ELECTRON TUBES; ELECTRONIC EQUIPMENT; EQUIPMENT; MAGNETIC MATERIALS; MATERIALS; MICROWAVE EQUIPMENT; MICROWAVE TUBES; TRANSITION ELEMENT ALLOYS
Optional Information
- Notes
- (c) 2004 American Institute of Physics.