Dynamic Range of CCD Photosensors for Atomic-Emission Analyzers

The dynamic range of charge coupled devices (CCD) is studied by an example of type TCD1304AP detectors in atomic-emission spectrometers. For this we have used an instrument developed by us with original methods for measuring the sensor temperature and analyzing nonlinear distortions at different signal levels. The principle of reciprocity of spectrum line brightness and exposure is used to monitor the nonlinearities of the paths for charge accumulation and transfer. The processing of measurement data and compensation of nonlinear distortions at different signal levels were carried out using a maximum likelihood method. Conditions were identified under which distortions arise at low, as well as high signal levels. A method for extending the dynamic range of CCD detectors based on the blooming effect is proposed.