Published August 2007 | Version v1
Journal article

Spatial resolution in Bragg-magnified X-ray images as determined by Fourier analysis

  • 1. Institut fuer Physik, Humboldt-Universitaet zu Berlin, Newtonstr. 15, 12489 Berlin (Germany)
  • 2. Institute of Synchrotron Radiation, Forschungszentrum Karsruhe, 76344 Eggenstein-Leopoldshafen (Germany)

Description

The spatial resolution of an imaging system is most often experimentally determined by using model objects and idealized imaging conditions. This traditional approach does not properly take into account the influence of noise and the dependence of contrast on the object. The latter influence is essential especially in the case of magnified X-ray images acquired by two fold asymmetric Bragg diffraction. For this phase sensitive technique the application of a criterion for spatial resolution based upon Fourier analysis is shown to provide reliable resolution values in a simple way, overcoming the limitations mentioned above. For the case of Bragg-magnified imaging of an ant leg with 166 fold magnification (effective pixel size 0.094 μm), the physical resolution achieved in the image is found to be 0.4 μm. (copyright 2007 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim) (orig.)

Availability note (English)

Available from: http://dx.doi.org/10.1002/pssa.200675685

Additional details

Identifiers

Publishing Information

Journal Title
Physica Status Solidi. A, Applied Research
Journal Volume
204
Journal Issue
8
Journal Page Range
p. 2746-2752
ISSN
0031-8965
CODEN
PSSABA

Conference

Title
8. biennial conference on high resolution X-ray diffraction and imaging
Acronym
XTOP 2006
Dates
19-21 Sep 2006
Place
Karlsruhe (Germany)

INIS

Country of Publication
Germany
Country of Input or Organization
Germany
INIS RN
38091306
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BRAGG REFLECTION; FOURIER ANALYSIS; IMAGE PROCESSING; SPATIAL RESOLUTION; X-RAY DIFFRACTION; X-RAY RADIOGRAPHY
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; INDUSTRIAL RADIOGRAPHY; MATERIALS TESTING; NONDESTRUCTIVE TESTING; PROCESSING; REFLECTION; RESOLUTION; SCATTERING; TESTING

Optional Information

Notes
With 3 figs., 14 refs.. SICI: 0031-8965(200708)204:8<2746::AID-PSSA200675685>3.0.TX;2-M