Spatial resolution in Bragg-magnified X-ray images as determined by Fourier analysis
- 1. Institut fuer Physik, Humboldt-Universitaet zu Berlin, Newtonstr. 15, 12489 Berlin (Germany)
- 2. Institute of Synchrotron Radiation, Forschungszentrum Karsruhe, 76344 Eggenstein-Leopoldshafen (Germany)
Description
The spatial resolution of an imaging system is most often experimentally determined by using model objects and idealized imaging conditions. This traditional approach does not properly take into account the influence of noise and the dependence of contrast on the object. The latter influence is essential especially in the case of magnified X-ray images acquired by two fold asymmetric Bragg diffraction. For this phase sensitive technique the application of a criterion for spatial resolution based upon Fourier analysis is shown to provide reliable resolution values in a simple way, overcoming the limitations mentioned above. For the case of Bragg-magnified imaging of an ant leg with 166 fold magnification (effective pixel size 0.094 μm), the physical resolution achieved in the image is found to be 0.4 μm. (copyright 2007 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim) (orig.)
Availability note (English)
Available from: http://dx.doi.org/10.1002/pssa.200675685Additional details
Identifiers
Publishing Information
- Journal Title
- Physica Status Solidi. A, Applied Research
- Journal Volume
- 204
- Journal Issue
- 8
- Journal Page Range
- p. 2746-2752
- ISSN
- 0031-8965
- CODEN
- PSSABA
Conference
- Title
- 8. biennial conference on high resolution X-ray diffraction and imaging
- Acronym
- XTOP 2006
- Dates
- 19-21 Sep 2006
- Place
- Karlsruhe (Germany)
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 38091306
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BRAGG REFLECTION; FOURIER ANALYSIS; IMAGE PROCESSING; SPATIAL RESOLUTION; X-RAY DIFFRACTION; X-RAY RADIOGRAPHY
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; INDUSTRIAL RADIOGRAPHY; MATERIALS TESTING; NONDESTRUCTIVE TESTING; PROCESSING; REFLECTION; RESOLUTION; SCATTERING; TESTING
Optional Information
- Notes
- With 3 figs., 14 refs.. SICI: 0031-8965(200708)204:8<2746::AID-PSSA200675685>3.0.TX;2-M