Published 2002 | Version v1
Journal article

Surface excitations in thin helium films on silica aerogel

  • 1. Institut Laue Langevin, B.P.156, 38042, Grenoble Cedex 9 (France)
  • 2. Institute for Physics and Power Engineering, 249020, Bondarenko sq.1, Obninsk (Russian Federation)
  • 3. CNRS-CRTBT, 38042 Grenoble Cedex 9 (France)
  • 4. Fachbereich Physik, Universitaet Konstanz, 78434 Konstanz (Germany)

Description

First measurements are reported on pure surface excitations in thin superfluid 4He films on silica aerogel. The ripplon dispersion curve is found to be the same for helium on graphite and silica aerogel substrates. However, the layered roton line width in helium films on aerogel shows a pronounced broadening with respect to that found in helium films on graphite. (orig.)

Availability note (English)

Available from: http://dx.doi.org/10.1007/s003390201774

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics. A, Materials Science and Processing
Journal Volume
74
Journal Issue
1,Suppl
Journal Page Range
p. s1547-s1549
ISSN
0947-8396
CODEN
APAMFC

Optional Information

Notes
With 3 figs., 10 refs.