Published 1996
| Version v1
Miscellaneous
Determinations depth profiling of iron impurities on GaAs surfaces
Creators
- 1. Academia Sinica, SH (China). Shanghai Inst. of Nuclear Research, Laboratory of Nuclear Analysis Techniques Beijing Division
Description
no abstract available
Additional details
Publishing Information
- Imprint Title
- Laboratory of nuclear analysis techniques academia sinica annual report (1995)
- Imprint Pagination
- 100 p.
- Journal Page Range
- p. 76-80
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 31032183
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Non-conventional Literature, No Abstract, Numerical Data
- Descriptors DEI
- ACCURACY; DATA PROCESSING; EXPERIMENTAL DATA; GALLIUM ARSENIDES; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- ARSENIC COMPOUNDS; ARSENIDES; CHEMICAL ANALYSIS; DATA; GALLIUM COMPOUNDS; INFORMATION; NONDESTRUCTIVE ANALYSIS; NUMERICAL DATA; PNICTIDES; PROCESSING; X-RAY EMISSION ANALYSIS