Fast neutrons from thick helium target irradiated by 17 MeV deuterons
Description
The spectral yield of fast neutrons from the d+He (thick target) reaction has been measured at different angles for the incident deuteron energy of 17 MeV. The measurement has been performed in an open geometry employing the shadow-bar method. The scintillation detection technique with two-dimensional n-γ discrimination electronics has been used. In the measurement, the list mode of the PC data-acquisition system was effectively employed in the elimination of the parasitic neutron contribution, caused by the random fluctuation of the beam-spot position out of the target window. The measured angular distribution of the neutron yield was compared with relevant data of the reaction Be(d, xn). The high yield, Gaussian-like shape of the energy spectrum and strongly forward-directed emission of neutrons from the thick He target seem to be advantageous for selected irradiation tasks
Additional details
Identifiers
- PII
- S0168900201002911;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 466
- Journal Issue
- 3
- Journal Page Range
- p. 509-512
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Germany
- INIS RN
- 33062774
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ANGULAR DISTRIBUTION; DATA ACQUISITION SYSTEMS; DEUTERON BEAMS; FAST NEUTRONS; HELIUM 4 TARGET; MEV RANGE 10-100; NUCLEAR REACTION YIELD; OPEN CONFIGURATIONS; PERSONAL COMPUTERS; SCINTILLATION COUNTING
- Descriptors DEC
- BARYONS; BEAMS; COMPUTERS; COUNTING TECHNIQUES; DIGITAL COMPUTERS; DISTRIBUTION; ELEMENTARY PARTICLES; ENERGY RANGE; FERMIONS; HADRONS; ION BEAMS; MAGNETIC FIELD CONFIGURATIONS; MEV RANGE; MICROCOMPUTERS; NEUTRONS; NUCLEONS; TARGETS; YIELDS
Optional Information
- Copyright
- Copyright (c) 2001 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.