Published September 20, 1985 | Version v1
Journal article Metadata-only

X-ray attenuation of silicon in the energy range 25-50 keV

Creators

  • 1. Australian Radiation Lab., Yallambie
  • 2. Melbourne Univ., Parkville (Australia). School of Physics

Description

Precise measurements of the x-ray attenuation coefficient of crystalline silicon have been made in the energy range 25 to 50 keV. The results are compared with theoretical predictions and earlier measurements. A systematic discrepancy between theory and experiment is observed. The most likely cause of the disagreement is thought to be the uncertainty in the estimation of the thermal diffuse scattering cross section. (author)

Additional details

Publishing Information

Journal Title
J. Phys., C (London). Solid State Phys.
Journal Volume
18
Journal Issue
26
Series
J. Phys., C (London). Solid State Phys.
Journal Page Range
5215-5223
ISSN
0022-3719
CODEN
JPSOA

INIS

Country of Publication
United Kingdom
Country of Input or Organization
United Kingdom
INIS RN
17004691
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ATTENUATION; CROSS SECTIONS; KEV RANGE 10-100; SCATTERING; SILICON; X RADIATION
Descriptors DEC
ELECTROMAGNETIC RADIATION; ELEMENTS; ENERGY RANGE; IONIZING RADIATIONS; KEV RANGE; RADIATIONS; SEMIMETALS