Quantitative APT analysis of Ti(C,N)
- 1. Department of Applied Physics, Microscopy and Microanalysis group, Chalmers University of Technology, SE-412 96 Gothenburg (Sweden)
- 2. R and D Sandvik Tooling, SE-126 80 Stockholm (Sweden)
- 3. Imago Scientific Instruments, Madison, WI 53711 (United States)
Description
A specially produced Ti(C,N) standard material, with a known nominal composition, was investigated with laser assisted atom probe tomography. The occurrence of molecular ions and single/multiple events was found to be influenced by the laser pulse energy, and especially C related events were affected. Primarily two issues were considered when the composition of Ti(C,N) was determined. The first one is connected to detector efficiency, due to the detector dead-time. The second one is connected to peak overlap in the mass spectrum. A method is proposed for quantification of the C content in order to establish the C/N ratio. A correction was made to the major C peaks, C at 6 and 12 Da, with the 13C isotopes, at 6.5 and 13 Da, according to the known natural abundance. In addition, a correction of the peak at 24 Da, where C and Ti overlap, is proposed based on the occurrence of single/multiple events for respective element. The results were compared to the results from other techniques such as electron energy loss spectroscopy, chemical analysis and X-ray diffraction. After applying the corrections, atom probe tomography results were satisfactory. Furthermore, the content of dissolved O in Ti(C,N) was successfully quantified. -- Research highlights: → We quantify a Ti(C,N) standard material with a specific stoichiometry. → We evaluate the impact of different laser energies on the mass spectrum. → A correction method is presented to solve problems with overlap and losses of counts in major peaks. → APT analysis as a quantitative tool was compared with other techniques such as EELS, X-ray diffraction (XRD) and chemical analysis.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.ultramic.2011.01.031Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2011.01.031;
- PII
- S0304-3991(11)00054-4;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 111
- Journal Issue
- 6
- Journal Page Range
- p. 609-614
- ISSN
- 0304-3991
- CODEN
- ULTRD6
Conference
- Title
- 52. international field emission symposium
- Acronym
- IFES2010
- Dates
- 5-8 Jul 2010
- Place
- Sydney (Australia)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45025336
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMS; CARBON 13; CHEMICAL ANALYSIS; COMPARATIVE EVALUATIONS; CORRECTIONS; ELECTRONS; ENERGY-LOSS SPECTROSCOPY; LASER RADIATION; MASS SPECTRA; MOLECULAR IONS; PROBES; TITANIUM CARBIDES; TITANIUM NITRIDES; TOMOGRAPHY; X-RAY DIFFRACTION
- Descriptors DEC
- CARBIDES; CARBON COMPOUNDS; CARBON ISOTOPES; CHARGED PARTICLES; COHERENT SCATTERING; DIAGNOSTIC TECHNIQUES; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; ELEMENTARY PARTICLES; EVALUATION; EVEN-ODD NUCLEI; FERMIONS; IONS; ISOTOPES; LEPTONS; LIGHT NUCLEI; NITRIDES; NITROGEN COMPOUNDS; NUCLEI; PNICTIDES; RADIATIONS; SCATTERING; SPECTRA; SPECTROSCOPY; STABLE ISOTOPES; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.