Published May 2011 | Version v1
Journal article

Quantitative APT analysis of Ti(C,N)

  • 1. Department of Applied Physics, Microscopy and Microanalysis group, Chalmers University of Technology, SE-412 96 Gothenburg (Sweden)
  • 2. R and D Sandvik Tooling, SE-126 80 Stockholm (Sweden)
  • 3. Imago Scientific Instruments, Madison, WI 53711 (United States)

Description

A specially produced Ti(C,N) standard material, with a known nominal composition, was investigated with laser assisted atom probe tomography. The occurrence of molecular ions and single/multiple events was found to be influenced by the laser pulse energy, and especially C related events were affected. Primarily two issues were considered when the composition of Ti(C,N) was determined. The first one is connected to detector efficiency, due to the detector dead-time. The second one is connected to peak overlap in the mass spectrum. A method is proposed for quantification of the C content in order to establish the C/N ratio. A correction was made to the major C peaks, C at 6 and 12 Da, with the 13C isotopes, at 6.5 and 13 Da, according to the known natural abundance. In addition, a correction of the peak at 24 Da, where C and Ti overlap, is proposed based on the occurrence of single/multiple events for respective element. The results were compared to the results from other techniques such as electron energy loss spectroscopy, chemical analysis and X-ray diffraction. After applying the corrections, atom probe tomography results were satisfactory. Furthermore, the content of dissolved O in Ti(C,N) was successfully quantified. -- Research highlights: → We quantify a Ti(C,N) standard material with a specific stoichiometry. → We evaluate the impact of different laser energies on the mass spectrum. → A correction method is presented to solve problems with overlap and losses of counts in major peaks. → APT analysis as a quantitative tool was compared with other techniques such as EELS, X-ray diffraction (XRD) and chemical analysis.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.ultramic.2011.01.031

Additional details

Identifiers

DOI
10.1016/j.ultramic.2011.01.031;
PII
S0304-3991(11)00054-4;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
111
Journal Issue
6
Journal Page Range
p. 609-614
ISSN
0304-3991
CODEN
ULTRD6

Conference

Title
52. international field emission symposium
Acronym
IFES2010
Dates
5-8 Jul 2010
Place
Sydney (Australia)

Optional Information

Copyright
Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.