Applications of ion beam analysis for materials characterization as complementary technique to activation analysis

Ion beam analysis (IBA), performed with energetic protons, alpha particles or heavy ion beams obtained from a particle accelerator, is extensively utilised for the compositional analysis of materials. The analysis entails the determination of elements, their depth distribution in surface and near surface regions and in some cases, their isotopic abundances as well. Sensitivity to low Z elements including hydrogen, oxygen and fluorine is an important feature of IBA which together with depth perception capability distinguishes it from activation analysis, neutron activation analysis in particular, which is widely used for the bulk determination of mid and high Z elements in materials. Ion beam analysis, in general, represents an array of techniques amongst which particle induced g-ray emission (PIGE) and nuclear reaction analysis (NRA) are more applicable for the determination of elements over larger depths. Taking this into cognizance, the presentation will describe the principles and the applications of the two methods. The later part will encompass determination of low Z elements in binary, ternary and also, multinary materials that find applications in energy, space and other areas. A few examples will also be presented to emphasise the isotopic discrimination capability of the methods. A portion of the presentation will dwell on depth profiling applications wherein the methodologies for determining depth profiles using resonant and non-resonant nuclear reactions will be elucidated. Finally, the salient features of IBA that include its non-destructive nature, and certain pit-falls in conducting IBA measurements will be discussed. (author)