Published June 2000
| Version v1
Journal article
Comparison of the chemical erosion of Si, C and SiC under deuterium ion bombardment
Creators
Description
Erosion yields of Si, C and SiC due to D ion impact were determined between 20 and 300 eV up to 1100 K. A temperature dependence of the erosion yield has been observed for Si and C. The temperature of the maximum increases with ion energy from about 350 K for 20 eV to 570 K above 100 eV for Si, which is always about 250 K lower than for graphite. The erosion yields of Si are in general 10 times smaller than those of graphite. Chemical erosion species were observed mass-spectroscopically: silane was found for Si, but not for SiC, where only hydrocarbons were observed
Additional details
Identifiers
- PII
- S0022311500000325;
Publishing Information
- Journal Title
- Journal of Nuclear Materials
- Journal Volume
- 279
- Journal Issue
- 2-3
- Journal Page Range
- p. 351-355
- ISSN
- 0022-3115
- CODEN
- JNUMAM
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 34036938
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- DEUTERIUM IONS; ENERGY DEPENDENCE; EROSION; EV RANGE 10-100; EV RANGE 100-1000; GRAPHITE; HYDROCARBONS; MASS SPECTROSCOPY; SILANES; SILICON; SILICON CARBIDES; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0273-0400 K; TEMPERATURE RANGE 0400-1000 K; TEMPERATURE RANGE 1000-4000 K
- Descriptors DEC
- CARBIDES; CARBON; CARBON COMPOUNDS; CHARGED PARTICLES; ELEMENTS; ENERGY RANGE; EV RANGE; HYDRIDES; HYDROGEN COMPOUNDS; IONS; MINERALS; NONMETALS; ORGANIC COMPOUNDS; ORGANIC SILICON COMPOUNDS; SEMIMETALS; SILICON COMPOUNDS; SPECTROSCOPY; TEMPERATURE RANGE
Optional Information
- Copyright
- Copyright (c) 2000 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.