Digital radiology: an opportunity for quantitative measurement
Creators
- 1. CEA Grenoble, Lab. d'Electronique et de Technologie de l'Informatique, LETI Minatec, Dept. of Technologies for Biology and Health, 38 (France)
Description
A digital detector provides numerical information at each pixel. This value may be difficult to be interpreted quantitatively. In this paper, the main factors to be considered during physical interpretation are reviewed: beam-hardening effect, scattering diffusion, type of detector. Some of them induce degradation on the digital radiograph while others modify the nature of available information. Signal-to-noise ratio should be taken into account, and compared to the accuracy required by the inspection process. Different existing methods are discussed for scatter correction. Then we analyse different techniques of digital radiography based on the quantitative aspect - thus assuming good accuracy of radiographs values: tomography and 3D techniques, and dual-energy approaches. Finally we evoke emergent detectors based on semi-conductors, which are energy selective photon-counters, thus offer new opportunities in terms of information processing. (authors)
Availability note (English)
Available from INSA-Lyon, Laboratoire CNDRI, Bat Saint Exupery, 69621 - Villeurbanne Cedex (France)Additional details
Publishing Information
- Imprint Pagination
- 10 p.
- Report number
- INIS-FR--08-1088
Conference
- Title
- International symposium on digital industrial radiology and computed tomography
- Acronym
- DIR 2007
- Dates
- 25-27 Jun 2007
- Place
- Lyon (France)
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 39104375
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S62: RADIOLOGY AND NUCLEAR MEDICINE; S42: ENGINEERING;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- ACCURACY; ATTENUATION; CALIBRATION; CDTE SEMICONDUCTOR DETECTORS; COMPUTERIZED TOMOGRAPHY; CORRECTIONS; DATA COVARIANCES; DIGITAL SYSTEMS; HARDENING; IMAGE PROCESSING; SCATTERING; SIGNAL-TO-NOISE RATIO; X-RAY RADIOGRAPHY
- Descriptors DEC
- DIAGNOSTIC TECHNIQUES; DIMENSIONLESS NUMBERS; INDUSTRIAL RADIOGRAPHY; MATERIALS TESTING; MEASURING INSTRUMENTS; NONDESTRUCTIVE TESTING; PROCESSING; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; TESTING; TOMOGRAPHY
Optional Information
- Notes
- 14 refs.