Published 2010 | Version v1
Miscellaneous

The effects of substrate temperature and deposition time on structural and optical properties of 0.08M ZnO thin films

  • 1. Akdeniz University, Antalya (Turkey)
  • 2. Mehmet Akif Ersoy University, Burdur (Turkey)

Description

ZnO thin films were deposited by the ultrasonic spray pyrolysis technique onto microscope glass slides. The substrate temperature was varied from 350 degree C to 400 degree C in 25 degree C steps for the Set-1 and Set-2 samples having a 25 min and 50 min, respectively. The influence of substrate temperature and deposition time on structural and optical properties of 0.08M ZnO thin films was systematically investigated. The optical transmission spectra obtained over the 300-900 nm spectral range with a Cary-100 spectrophotometer were used to determine the optical constants of the ZnO films such as thickness, refractive index, and the optical band gaps. It is observed that while the film thickness decreases from 1455 nm to 870 nm for Set-1 and from 795 nm to 350 nm for the Set-2 samples with the substrate temperature, the refractive indices increases. However, the band gap values are about 3.2 eV.

Part of:
Book of Abstracts

Additional details

Additional titles

Original title (English)
Oezetler Kitabi

Publishing Information

Imprint Place
Istanbul (Turkey)
Imprint Title
Book of Abstracts
Imprint Pagination
710 p.
Journal Page Range
p. 432
Report number
INIS-TR--0153

Conference

Title
Turkish Physical Society 26. International Physics Congress
Original Conference Title
Turk Fizik Dernegi 26. Uluslararasi Fizik Kongresi
Dates
24-27 Sep 2009
Place
Bodrum (Turkey)

INIS

Country of Publication
Turkey
Country of Input or Organization
Turkey
INIS RN
42089059
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference, Non-conventional Literature, Numerical Data
Descriptors DEI
COATINGS; DEPOSITION; FILMS; MEASURING INSTRUMENTS; NUMERICAL DATA; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; REFRACTIVE INDEX; SPECTROMETERS; SPECTROPHOTOMETERS; SPECTROPHOTOMETRY; SUBSTRATES; SURFACE COATING; THICKNESS; THIN FILMS
Descriptors DEC
DATA; DEPOSITION; DIMENSIONS; FILMS; INFORMATION; MEASURING INSTRUMENTS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES

Optional Information

Notes
Imprint:Oezetler Kitabi