Published May 23, 1983
| Version v1
Patent
Open
Instrument for measurement of charge and duration of charged particle clusters
Description
Instrument for measuring the charge and charged cluster duration, containing an electrooptical crystal and a photoreceiving device is described. To increase sensitivity and measurement accuracy an elliptical thin-wall metal ring installed in the electrooptical crystal and insulation plate is additionally put inside the electron guide. Additional standard voltage is applied to the insulation plate metallized surface. Under 3x10-2 m electron guide diameter and 10-3 m thickness of ZnSe crystal and similar dimensions of insulation plate introduction of an additional ring increases the crystal sensitivity 10 times
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Additional details
Additional titles
- Original title (Russian)
- Устройство для измерения заряда и длительности сгустков заряженных частиц
Publishing Information
- Imprint Pagination
- 4 p.
- IPC:
- Int. Cl. H 05 H 7/00.
- IPC
- Int. Cl. H 05 H 7/00.
- Patent number
- SU patent document 1120910/A/
INIS
- Country of Publication
- USSR
- Country of Input or Organization
- USSR
- INIS RN
- 19095734
- Subject category
- S43: PARTICLE ACCELERATORS;
- Descriptors DEI
- BEAM MONITORS; CLUSTER BEAMS; CRYSTALS; ELECTRIC FIELDS; OPTICAL FIBERS; SENSITIVITY; THERMAL INSULATION
- Descriptors DEC
- BEAMS; FIBERS; MEASURING INSTRUMENTS; MONITORS
Optional Information
- Notes
- 1 fig.