Published May 23, 1983 | Version v1
Patent Open

Instrument for measurement of charge and duration of charged particle clusters

Description

Instrument for measuring the charge and charged cluster duration, containing an electrooptical crystal and a photoreceiving device is described. To increase sensitivity and measurement accuracy an elliptical thin-wall metal ring installed in the electrooptical crystal and insulation plate is additionally put inside the electron guide. Additional standard voltage is applied to the insulation plate metallized surface. Under 3x10-2 m electron guide diameter and 10-3 m thickness of ZnSe crystal and similar dimensions of insulation plate introduction of an additional ring increases the crystal sensitivity 10 times

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Additional details

Additional titles

Original title (Russian)
Устройство для измерения заряда и длительности сгустков заряженных частиц

Publishing Information

Imprint Pagination
4 p.
IPC:
Int. Cl. H 05 H 7/00.
IPC
Int. Cl. H 05 H 7/00.
Patent number
SU patent document 1120910/A/

INIS

Country of Publication
USSR
Country of Input or Organization
USSR
INIS RN
19095734
Subject category
S43: PARTICLE ACCELERATORS;
Descriptors DEI
BEAM MONITORS; CLUSTER BEAMS; CRYSTALS; ELECTRIC FIELDS; OPTICAL FIBERS; SENSITIVITY; THERMAL INSULATION
Descriptors DEC
BEAMS; FIBERS; MEASURING INSTRUMENTS; MONITORS

Optional Information

Notes
1 fig.