Adding a dynamic aspect to amplitude–wavelength space

Amplitude–wavelength (AW) space is a well-established technique for depicting the operational performance of surface texture measuring instruments. The introduction of a third parameter to AW space, the in-plane scanning speed, is described. We present a discussion of the equations derived from operational constraints and parameter interdependencies for a scanning stylus instrument: the National Physical Laboratory's Areal Instrument. Constraints derive from instrument range, resolution, range of measurement force, probe tip geometry and the synchronization of data acquisition. The equations combine to form a polygon in amplitude–wavelength–scanning speed space that defines the operating region of the instrument