Published July 1, 2012
| Version v1
Journal article
Stoichiometric controlling of pulsed laser deposited boron-carbon thin films
- 1. Department of Electronic Science and Technology, Huazhong University of Science and Technology, 1037 Luoyu Road, Wuhan 430074 (China)
- 2. State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology, Wuhan 430070 (China)
Description
The stoichiometry of B-C thin films was controlled via pulsed laser deposition using a series of ceramic B-C targets (B/C ratio was 3.04-5.92). The effects of B/C ratio in target, laser power and substrate-to-target distance on deposition rate, microstructure, stoichiometry and chemical structure were investigated. The maximum deposition rate was obtained at laser power of 90 mJ and substrate-to-target distance of 50 mm. Boron rich B-C films were obtained and the stoichiometry in B-C thin films was controlled in the range 2.9-4.6. Carbon atoms were bonded with only sp3 hybridization when boron was rich,but with sp2 and sp3 hybridizations when carbon was rich.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physb.2012.03.026Additional details
Identifiers
- DOI
- 10.1016/j.physb.2012.03.026;
- PII
- S0921-4526(12)00259-1;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 407
- Journal Issue
- 13
- Journal Page Range
- p. 2382-2384
- ISSN
- 0921-4526
- CODEN
- PHYBE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43089792
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ATOMS; BORON COMPOUNDS; CARBON COMPOUNDS; CERAMICS; ENERGY BEAM DEPOSITION; LASER RADIATION; MICROSTRUCTURE; PULSED IRRADIATION; STOICHIOMETRY; SUBSTRATES; THIN FILMS; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- DEPOSITION; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; FILMS; IRRADIATION; PHOTOELECTRON SPECTROSCOPY; RADIATIONS; SPECTROSCOPY; SURFACE COATING
Optional Information
- Copyright
- Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.