Published July 1, 2012 | Version v1
Journal article

Stoichiometric controlling of pulsed laser deposited boron-carbon thin films

  • 1. Department of Electronic Science and Technology, Huazhong University of Science and Technology, 1037 Luoyu Road, Wuhan 430074 (China)
  • 2. State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology, Wuhan 430070 (China)

Description

The stoichiometry of B-C thin films was controlled via pulsed laser deposition using a series of ceramic B-C targets (B/C ratio was 3.04-5.92). The effects of B/C ratio in target, laser power and substrate-to-target distance on deposition rate, microstructure, stoichiometry and chemical structure were investigated. The maximum deposition rate was obtained at laser power of 90 mJ and substrate-to-target distance of 50 mm. Boron rich B-C films were obtained and the stoichiometry in B-C thin films was controlled in the range 2.9-4.6. Carbon atoms were bonded with only sp3 hybridization when boron was rich,but with sp2 and sp3 hybridizations when carbon was rich.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.physb.2012.03.026

Additional details

Identifiers

DOI
10.1016/j.physb.2012.03.026;
PII
S0921-4526(12)00259-1;

Publishing Information

Journal Title
Physica. B, Condensed Matter
Journal Volume
407
Journal Issue
13
Journal Page Range
p. 2382-2384
ISSN
0921-4526
CODEN
PHYBE3

Optional Information

Copyright
Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.