Analog front-end design of the STS/MUCH-XYTER2—full size prototype ASIC for the CBM experiment
Creators
- 1. AGH University of Science and Technology, Av. A. Mickiewicza 30, 30-059 Cracow (Poland)
Description
The design of the analog front-end of the STS/MUCH-XYTER2 ASIC, a full-size prototype chip for the Silicon Tracking System (STS, based on double-sided silicon strip sensors) and Muon Chamber (MUCH, based on gas sensors) detectors is presented. The ASIC contains 128 charge processing channels, each built of a charge sensitive amplifier, a polarity selection circuit and two pulse shaping amplifiers forming two parallel signal paths. The first path is used for timing measurement with a fast discriminator. The second path allows low-noise amplitude measurement with a 5-bit continuous-time flash ADC. Different operating conditions and constraints posed by two target detectors' applications require front-end electronics flexibility to meet extended system-wise requirements. The presented circuit implements switchable shaper peaking time, gain switching and trimming, input amplifier pulsed reset circuit, fail-safe measures. The power consumption is scalable (for the STS and the MUCH modes), but limited to 10 mW/channel.
Availability note (English)
Available from http://dx.doi.org/10.1088/1748-0221/12/01/C01053Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Instrumentation
- Journal Volume
- 12
- Journal Issue
- 01
- Journal Page Range
- p. C01053
- ISSN
- 1748-0221
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49020052
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- AMPLIFIERS; AMPLITUDES; ANALOG-TO-DIGITAL CONVERTERS; CBM DETECTOR; DISCRIMINATORS; FLEXIBILITY; GAIN; MUONS; NOISE; PULSES; SENSORS; SI SEMICONDUCTOR DETECTORS; SIGNALS; SILICON
- Descriptors DEC
- AMPLIFICATION; ELECTRONIC CIRCUITS; ELECTRONIC EQUIPMENT; ELEMENTARY PARTICLES; ELEMENTS; EQUIPMENT; FERMIONS; LEPTONS; MEASURING INSTRUMENTS; MECHANICAL PROPERTIES; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMIMETALS; TENSILE PROPERTIES