Published January 20, 2020
| Version v1
Journal article
Femtosecond laser ablation of a thin silver film in air and water
Creators
- 1. Russian Academy of Sciences. Lebedev Physical Institute (Russian Federation)
- 2. Far East Branch of the Russian Academy of Sciences. Institute of Automation and Control Processes (Russian Federation)
- 3. Far Eastern Federal University (Russian Federation)
Description
In this work, single-shot craters were produced by femtosecond laser ablation using an objective with a numerical aperture NA = 0.25 and laser pulses with the 0.3-ps width and the central wavelength of 515 nm. Ablation was performed in air and distilled water. A sample, 65-nm thick silver film, was prepared by magnetron sputtering onto silica glass and crystalline silicon substrates. Craters were visualized by a scanning electron microscope. Some differences were found in the morphology of craters, depending on the substrate and on the ambient medium. A drastic increase in the crater size was observed during the ablation in water, which is explained by filamentation that occurs when the peak pulse power exceeds 1.3 MW.
Additional details
Identifiers
Publishing Information
- Journal Title
- Optical and Quantum Electronics
- Journal Volume
- 52
- Journal Issue
- 2
- Journal Page Range
- vp.
- ISSN
- 0306-8919
- CODEN
- OQELDI
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 55106534
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABLATION; AIR; APERTURES; CRATERS; MAGNETRONS; MORPHOLOGY; PULSES; SCANNING ELECTRON MICROSCOPY; SILICA; SILICON; SILVER; SPUTTERING; SUBSTRATES; THIN FILMS; WAVELENGTHS
- Descriptors DEC
- CAVITIES; ELECTRON MICROSCOPY; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FILMS; FLUIDS; GASES; METALS; MICROSCOPY; MICROWAVE EQUIPMENT; MICROWAVE TUBES; MINERALS; OPENINGS; OXIDE MINERALS; SEMIMETALS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2020 © Springer Science+Business Media, LLC, part of Springer Nature 2020